RELIABILITY PERFORMANCE OF ETOX BASED FLASH MEMORIES.

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1988, Pages 158-166

  Verma, Gautam ^a   Mielke, Neal ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA STORAGE UNITS - FAILURE;

FLASH MEMORIES; PROGRAM/ERASE CYCLING; RELIABILITY PERFORMANCE;

DATA STORAGE, SEMICONDUCTOR;

EID: 0023829362     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/irps.1988.362216     Document Type: Conference Paper

References (6)