OVERHEAD IN SCAN AND SELF-TESTING DESIGNS.

Digest of Papers - International Test Conference

Volumn , Issue , 1987, Pages 460-470

  Ohletz, M J ^a   Williams, T W ^a   Mucha, J P ^a  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

LOGIC DEVICES - GATES; SEMICONDUCTOR DEVICES, MOS - DESIGN; TRANSISTORS;

GATE AND TRANSISTOR LEVELS; LOGIC GATE OVERHEAD; SCAN AND SELF-TESTING DESIGNS;

AUTOMATIC TESTING;

EID: 0023588522     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (19)