TRANSMISSION X-RAY TOPOGRAPHY OF SINGLE CRYSTAL QUARTZ USING WHITE BEAM SYNCHROTRON RADIATION.

Proceedings of the Annual IEEE International Frequency Control Symposium

Volumn , Issue , 1987, Pages 228-235

  Hanson, William ^a  

^a Piezo Crystal Co   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS - DEFECTS;

DEFECT ANALYSIS; SINGLE CRYSTAL QUARTZ; WHITE BEAM SYNCHROTRON RADIATION; X-RAY TOPOGRAPHY;

QUARTZ;

EID: 0023586537     PISSN: 01616404     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/freq.1987.201027     Document Type: Conference Paper

References (8)