MODELS FOR TOTAL DOSE DEGRADATION OF LINEAR INTEGRATED CIRCUITS.

IEEE Transactions on Nuclear Science

Volumn NS-34, Issue 6, 1987, Pages

  Johnston, A H ^a   Plaag, R E ^a  

^a BOEING COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GAMMA RAYS; RADIATION EFFECTS - COMPUTER AIDED ANALYSIS; TRANSISTORS - DEGRADATION;

2-D COMPUTER MODELING; LINEAR INTEGRATED CIRCUITS; TOTAL DOSE DEGRADATION;

INTEGRATED CIRCUITS, LINEAR;

EID: 0023573807     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (15)