1 THZ BANDWIDTH PROBING OF DEVICES AND INTEGRATED CIRCUITS.

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1987, Pages 857-858

  Valdmanis, J A ^a   Nuss, M C ^a   Smith, P R ^a   Li, K D ^a   Pei, S S ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC WAVEFORMS - MEASUREMENTS; ELECTROOPTICAL EFFECTS; LASERS, DYE; SUBSTRATES - TESTING;

1 THZ BANDWIDTH PROBING; EXTERNAL ELECTRO-OPTIC SAMPLING;

INTEGRATED CIRCUIT TESTING;

EID: 0023570221     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/iedm.1987.191570     Document Type: Conference Paper

References (2)