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Volumn , Issue , 1987, Pages 88-92
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CHARGED DEVICE MODEL TESTING; TRYING TO DUPLICATE REALITY.
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC DISCHARGES;
ELECTROSTATICS - ELECTRIC CHARGE;
CHARGED DEVICE MODEL;
CUSTOMER RETURNS;
DIP PACKAGE;
DISCHARGE PATH;
FAILURE THRESHOLDS;
SMALL OUTLINE (SO) PACKAGE;
INTEGRATED CIRCUIT TESTING;
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EID: 0023570164
PISSN: 07395159
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (25)
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References (6)
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