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Volumn , Issue , 1987, Pages 82-85
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EMITTER RESISTANCE IN POLYSILICON EMITTER TRANSISTORS AND THE INFLUENCE OF INTERFACIAL OXIDES.
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC MEASUREMENTS - RESISTANCE;
EMITTER RESISTANCE MEASUREMENT;
INTERFACIAL OXIDE EFFECT;
POLYSILICON EMITTER TRANSISTORS;
TRANSISTORS, BIPOLAR;
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EID: 0023567790
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (7)
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References (11)
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