EFFICIENT TEST COVERAGE DETERMINATION FOR DELAY FAULTS.

Digest of Papers - International Test Conference

Volumn , Issue , 1987, Pages 418-427

  Carter, J L ^a   Iyengar, V S ^a   Rosen, B K ^a  

^a IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE ANALYSIS - MATHEMATICAL MODELS; MATHEMATICAL TECHNIQUES - ALGORITHMS; WAVEFORM ANALYSIS;

DELAY FAULTS COVERAGE DETERMINATION; FAULT-ORIENTED DETERMINISTIC TEST GENERATORS; RANDOM PATTERN TEST ENVIRONMENT; STUCK-AT FAULTS;

INTEGRATED CIRCUIT TESTING;

EID: 0023567773     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (22)