FIRST NONDESTRUCTIVE MEASUREMENTS OF POWER MOSFET SINGLE EVENT BURNOUT CROSS SECTIONS.

IEEE Transactions on Nuclear Science

Volumn NS-34, Issue 6, 1987, Pages

  Oberg, Dennis L ^a   Wert, Jerry L ^a  

^a BOEING COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR DEVICE TESTING - NONDESTRUCTIVE EXAMINATION; TRANSISTORS, FIELD EFFECT - RADIATION EFFECTS;

NONDESTRUCTIVE BURNOUT PULSE; POWER MOSFET; SINGLE EVENT BURNOUT;

SEMICONDUCTOR DEVICES, MOSFET;

EID: 0023567724     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (8)