ON THE ROLE OF INDEPENDENT FAULT SETS IN THE GENERATION OF MINIMAL TEST SETS.

Digest of Papers - International Test Conference

Volumn , Issue , 1987, Pages 1100-1107

  Akers, Sheldon B ^a   Joseph, Christie ^a   Krishnamurthy, Balakrishnan ^a  

^a UNIVERSITY OF MASSACHUSETTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE ANALYSIS; LOGIC CIRCUITS - TESTING;

BENCHMARK CIRCUITS; FAULT DOMINANCE; FAULT MATCHING; INDEPENDENT FAULT SETS; MINIMAL TEST SETS GENERATION;

AUTOMATIC TESTING;

EID: 0023564782     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)