Printed circuit board inspection - a novel approach

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 730, Issue , 1987, Pages 164-173

  Lees, David E B ^a   Henshaw, Philip D ^a  

^a SPARTA Inc ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER PROGRAMMING - ALGORITHMS; IMAGE PROCESSING;

'GOLDEN BOARD' IMAGE; DEFECT DETECTION; IMAGE COMPARISON TECHNIQUE; PHASE-ONLY IMAGE PROCESSING;

PRINTED CIRCUITS;

EID: 0023548744     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.937872     Document Type: Conference Paper

References (6)

1. G. Hroundas, “Testability Considerations for Bareboard Innerlayer Testing,” PC FAB, June 1985.
2. S. T. Jones, “ATE Finds a Partner: Inspection Systems for PCB Production,” Electrionics, June 1985.
3. P. C. Albertini, J. Lingameneni, and S. J. Silberberg, “Electrical Test and Optical Inspection,” PC FAB, Feb. 1985.
4. A. V. Oppenheim and J. S. Lim, “The Importance of Phase in Signals,” Proc. IEEE 69 (1981) 529-541.
5. P. D. Henshaw, “Image Comparison System,” U. S. Patent 4,513,441 (1985).
6. P. D. Henshaw, “Background Suppression for Moving Point Source Detection,” Proc. SPIE 359,169(1982).