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Volumn , Issue , 1987, Pages 336-339
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META-STABLE LEAKAGE PHENOMENON IN DRAM CHARGE STORAGE-VARIABLE HOLD TIME.
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Author keywords
[No Author keywords available]
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Indexed keywords
DATA STORAGE, SEMICONDUCTOR - TESTING;
DRAM STORAGE CHARGE;
DYNAMIC RAM (DRAM);
VARIABLE HOLD TIME (VHT) LEAKAGE;
DATA STORAGE, DIGITAL;
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EID: 0023548492
PISSN: 01631918
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (80)
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References (3)
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