INCREASED THROUGHPUT FOR THE TESTING AND REPAIR OF RAMS WITH REDUNDANCY.

Volumn , Issue , 1987, Pages 230-233

  Haddad, Ramsey W ^a   Dahbura, Anton T ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED ENGINEERING; DATA STORAGE SEMICONDUCTOR - DEFECTS; INTEGRATED CIRCUIT TESTING;

FAULTY MEMORY CELLS; REDUNDANT RANDOM ACCESS MEMORY(RRAM); REPAIRABILITY;

DATA STORAGE, DIGITAL;

EID: 0023545875     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)