SURFACE IMPACT IONIZATION IN SILICON DEVICES.

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1987, Pages 494-497

  Slotboom, J W ^a   Streuker, G ^a   Davids, G J T ^a   Hartog, P B ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

IONIZATION - COMPUTER SIMULATION; SEMICONDUCTING SILICON - IONIZATION;

IONIZATION RATE; MOS SUBSTRATE CURRENTS SIMULATION; SURFACE IMPACT IONIZATION;

SEMICONDUCTOR DEVICES, MOS;

EID: 0023544152     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/iedm.1987.191468     Document Type: Conference Paper

References (13)