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Volumn 19, Issue 2, 1987, Pages 113-123
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Optimal development testing policies for products sold with warranty
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Author keywords
[No Author keywords available]
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Indexed keywords
RELIABILITY;
OPTIMAL TESTING PLANS;
PRODUCT DEVELOPMENT;
STOCHASTIC MODELS;
PRODUCTION ENGINEERING;
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EID: 0023538537
PISSN: 01438174
EISSN: None
Source Type: Journal
DOI: 10.1016/0143-8174(87)90106-5 Document Type: Article |
Times cited : (17)
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References (8)
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