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Volumn 19, Issue 2, 1987, Pages 113-123

Optimal development testing policies for products sold with warranty

Author keywords

[No Author keywords available]

Indexed keywords

RELIABILITY;

EID: 0023538537     PISSN: 01438174     EISSN: None     Source Type: Journal    
DOI: 10.1016/0143-8174(87)90106-5     Document Type: Article
Times cited : (17)

References (8)
  • 6
    • 0001782167 scopus 로고
    • Reliability analysis for complex repairable system
    • F. Proschan, R.J. Serfling, SIAM, Philadelphia
    • (1974) Reliability & Biometry , pp. 397-410
    • Crow1
  • 8
    • 84914738802 scopus 로고    scopus 로고
    • Murthy, D. N. P. and Nguyen, D. G. Optimal Development Plans for New Products, submitted for publication.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.