SOFT-ERROR IMMUNE SWITCHED-LOAD-RESISTOR MEMORY CELL.

Digest of Technical Papers - Symposium on VLSI Technology

Volumn , Issue , 1987, Pages 37-38

  Homma, Noriyuki ^a   Nakamura, Tohru ^a   Hayashida, Tetsuya ^a   Matsumoto, Motoaki ^a   Nakazato, Kazuo ^a   Onai, Takahiro ^a   Tamaki, Youichi ^a   Namba, Mitsuo ^a   Sagara, Kazuhiko ^a   Ikeda, Kiyoji ^a  

^a HITACHI LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DATA STORAGE UNITS - RADIATION EFFECTS; DATA STORAGE, DIGITAL - RANDOM ACCESS;

ALPHA-PARTICLE INDUCED SOFT ERROR; SOFT ERROR IMMUNITY; SWITCHED-LOAD-RESISTOR MEMORY CELL;

DATA STORAGE, SEMICONDUCTOR;

EID: 0023534919     PISSN: 07431562     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)