FLICKER NOISE IN CMOS: A UNIFIED MODEL FOR VLSI PROCESSES.

Digest of Technical Papers - Symposium on VLSI Technology

Volumn , Issue , 1987, Pages 85-86

  Abidi, A A ^a   Viswanathan, C R ^a   Wu, J J M ^a   Wikstrom, J A ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

TRANSISTORS, FIELD EFFECT - SPECTRUM ANALYSIS;

FLICKER NOISE ANALYSIS; NMOS/PMOS;

SEMICONDUCTOR DEVICES, MOSFET;

EID: 0023531816     PISSN: 07431562     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)