THERE IS INFORMATION IN FAULTY SIGNATURES.

Digest of Papers - International Test Conference

Volumn , Issue , 1987, Pages 630-636

  McAnney, W H ^a   Savir, J ^a  

^a IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC CIRCUITS - TESTING; FAILURE ANALYSIS;

DIAGNOSTIC ALIASING; FAILING TESTS IDENTIFICATION; SIGNATURE ANALYSIS;

AUTOMATIC TESTING;

EID: 0023531337     PISSN: 07431686     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (1)