Small-signal analysis of semiconductor devices containing generation-recombination centers.

Volumn , Issue , 1987, Pages 207-212

  Gnudi, A ^a   Ciampolini, P ^a   Guerrieri, R ^a   Rudan, M ^a   Baccarani, G ^a  

^a UNIVERSITY OF BOLOGNA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER PROGRAMMING; SEMICONDUCTOR MATERIALS--CHARGE CARRIERS;

CARRIER STORAGE; DEEP TRAPS; GENERATION-RECOMBINATION CENTERS; SMALL SIGNAL ANALYSIS; STRESSED MOSFET;

SEMICONDUCTOR DEVICES, MOSFET;

EID: 0023526641     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/nascod.1987.721181     Document Type: Conference Paper

References (6)