New forms of shape invariants from elliptic fourier descriptors

Pattern Recognition

Volumn 20, Issue 5, 1987, Pages 535-545

  Lin, Chun Shin ^a   Hwang, Chia Lin ^b  

^a SAN DIEGO STATE UNIVERSITY   (United States)

^b NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

Elliptic feature matrix; Feature ellipse; Fourier descriptors; Invariant; Pattern recognition; Planar shape

Indexed keywords

MATHEMATICAL TECHNIQUES - GEOMETRY;

FEATURE ELLIPSE; FEWER COMPUTATIONS; FOURIER DESCRIPTORS; MATRIX TRACE OPERATORS; SHAPE INVARIANTS;

PATTERN RECOGNITION;

EID: 0023471150     PISSN: 00313203     EISSN: None     Source Type: Journal    
DOI: 10.1016/0031-3203(87)90080-X     Document Type: Article

References (15)

1. Visual pattern recognition by moment invariants
2. A modular vision system for sensor-controlled manipulation and inspection
3. SRI vision research for advanced industrial automation
4. A model-based vision system for industrial parts
5. On the encoding of arbitrary geometric configuration
6. Shape description via the use of critical points
7. Computer recognition of handwritten numerals by polygonal approximations
8. Fourier descriptors for plane closed curves
9. Fourier processing for hand print character recognition
10. Identification of 3-dimensional objects using Fourier descriptors of the boundary curve
11. Shape discrimination using Fourier descriptors
12. Analysis of three-dimensional movement using Fourier descriptors
13. Elliptic Fourier features of a closed contour