Location of 1/f Noise Sources in BJT's-II. Experiment

IEEE Transactions on Electron Devices

Volumn 34, Issue 9, 1987, Pages 2009-2012

  Pawlikiewicz, Adam H ^a   Van Der Ziel, Aldert ^b  

^a Energy Conversion Devices Inc   (United States)

^b UNIVERSITY OF MINNESOTA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NOISE, SPURIOUS SIGNAL; SEMICONDUCTING SILICON;

1/F NOISE; BIPOLAR FUNCTION TRANSISTORS; BJT; DIFFUSION NOISE;

TRANSISTORS, BIPOLAR;

EID: 0023421533     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1987.23188     Document Type: Article

References (13)

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