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Volumn 34, Issue 6, 1987, Pages 1290-1296

Static and Transient Lat-chup Simulation of VLSI-CMOS with an Improved Physical Design Model

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR DEVICES, MOS - MATHEMATICAL MODELS;

EID: 0023363467     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1987.23083     Document Type: Article
Times cited : (7)

References (16)
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    • (1983) IEEE Trans. Electron Devices , vol.30 ED , Issue.3
    • Wieder, A.1    Werner, C.2    Harter, J.3
  • 2
    • 0020243599 scopus 로고
    • Surface induced latch-up in VLSI CMOS circuits
    • D. Takacs, C. Werner, J. Harter, and U. Schwabe, “Surface induced latch-up in VLSI CMOS circuits, in IEDM Tech. Dig., pp. 458–461, 1982.
    • (1982) IEDM Tech. Dig , pp. 458-461
    • Takacs, D.1    Werner, C.2    Harter, J.3    Schwabe, U.4
  • 4
    • 0020844943 scopus 로고
    • An efficient numerical model of CMOS latch-up
    • Nov.
    • M.R. Pinto and R.W. Dutton, “An efficient numerical model of CMOS latch-up,” IEEE Electron Device Lett., vol. EDL-4, no. 11, Nov. 1983.
    • (1983) IEEE Electron Device Lett. , vol.4 EDL , Issue.11
    • Pinto, M.R.1    Dutton, R.W.2
  • 5
    • 0020704130 scopus 로고
    • A transient analysis of latch-up in bulk CMOS
    • Feb.
    • R.R. Troutman and H. Zappe, “A transient analysis of latch-up in bulk CMOS,” IEEE Trans. Electron Devices, vol. ED-30, no. 2, Feb. 1983.
    • (1983) IEEE Trans. Electron Devices , vol.30 ED , Issue.2
    • Troutman, R.R.1    Zappe, H.2
  • 6
    • 84939321090 scopus 로고    scopus 로고
    • Quasi 2-D simulation of transient latch-up effect in VLSI CMOS circuits
    • to be published.
    • J. Harter, H. Jacobs, M. Zwar, and H. Skapa, “Quasi 2-D simulation of transient latch-up effect in VLSI CMOS circuits,” IEEE Trans. Electron Devices, to be published.
    • IEEE Trans. Electron Devices
    • Harter, J.1    Jacobs, H.2    Zwar, M.3    Skapa, H.4
  • 7
    • 0020945552 scopus 로고
    • Transmission line model for latch-up in CMOS circuits
    • presented at the, Hawaii
    • R.R. Troutman and M.J. Hargrove, “Transmission line model for latch-up in CMOS circuits,” presented at the VLSI Symp., Hawaii, 1983.
    • (1983) VLSI Symp.
    • Troutman, R.R.1    Hargrove, M.J.2
  • 8
    • 6144254353 scopus 로고
    • A transmission line model for silicided diffusions: Impact on the performance of VLSI circuits
    • Apr.
    • D.B. Scott, W.R. Hunter, and H. Shichijo, “A transmission line model for silicided diffusions: Impact on the performance of VLSI circuits,” IEEE J. Solid-State Circuits, vol. SC-17, no. 2, Apr. 1982.
    • (1982) IEEE J. Solid-State Circuits , vol.17 SC , Issue.2
    • Scott, D.B.1    Hunter, W.R.2    Shichijo, H.3
  • 9
    • 0015614368 scopus 로고
    • Extended charge control model for bipolar transistors
    • J. Te Winkel, “Extended charge control model for bipolar transistors,” IEEE Trans. Electron Devices, vol. ED-20, no. 4, 1973.
    • (1973) IEEE Trans. Electron Devices , vol.20 ED , Issue.4
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  • 10
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    • Accurate trigger condition analysis for CMOS latch-up
    • Feb.
    • M.R. Pinto and R.W. Dutton, “Accurate trigger condition analysis for CMOS latch-up,” IEEE Electron Device Lett., vol. EDL-6, Feb. 1985.
    • (1985) IEEE Electron Device Lett. , vol.6 EDL
    • Pinto, M.R.1    Dutton, R.W.2
  • 11
    • 0022087622 scopus 로고
    • The dynamics of latch-up turn-on behavior in scaled CMOS
    • July
    • S. Odanaka, M. Wakabayashi, and T. Ohzone, “The dynamics of latch-up turn-on behavior in scaled CMOS,” IEEE Trans. Electron Devices, vol. ED-32, pp. 1334–1340, July 1985.
    • (1985) IEEE Trans. Electron Devices , vol.32 ED , pp. 1334-1340
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  • 15
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    • Layout considerations for preventing transiently triggered latch-up in CMOS
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    • R.R. Troutman and H. Zappe, “Layout considerations for preventing transiently triggered latch-up in CMOS,” IEEE Trans. Electron Devices, vol. ED-31, no. 3, Mar. 1984.
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    • Troutman, R.R.1    Zappe, H.2
  • 16
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    • Static and transient latch-up hardness in N-well CMOS with OnChip substrate bias generator
    • D. Takacs, J. Winnerl, and W. Reczek, “Static and transient latch-up hardness in N-well CMOS with OnChip substrate bias generator,” in IEDM Tech. Dig., 1985.
    • (1985) IEDM Tech. Dig.
    • Takacs, D.1    Winnerl, J.2    Reczek, W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.