-
1
-
-
0020719497
-
Design model for bulk CMOS scaling enabling accurate latch-up prediction
-
Mar.
-
A. Wieder, C. Werner, and J. Harter, “Design model for bulk CMOS scaling enabling accurate latch-up prediction,” IEEE Trans. Electron Devices, vol. ED-30, no. 3, Mar. 1983.
-
(1983)
IEEE Trans. Electron Devices
, vol.30 ED
, Issue.3
-
-
Wieder, A.1
Werner, C.2
Harter, J.3
-
2
-
-
0020243599
-
Surface induced latch-up in VLSI CMOS circuits
-
D. Takacs, C. Werner, J. Harter, and U. Schwabe, “Surface induced latch-up in VLSI CMOS circuits, in IEDM Tech. Dig., pp. 458–461, 1982.
-
(1982)
IEDM Tech. Dig
, pp. 458-461
-
-
Takacs, D.1
Werner, C.2
Harter, J.3
Schwabe, U.4
-
3
-
-
0021589942
-
A CMOS latch-up model including nonlinear effects
-
(Kobe, Japan)
-
T. Aoki, R. Kasai, and S. Horiguchi, “A CMOS latch-up model including nonlinear effects,” in Ext. Abs. 16th Conf. Sol. St. Dev. Mat. (Kobe, Japan), pp. 241–244, 1984.
-
(1984)
Ext. Abs. 16th Conf. Sol. St. Dev. Mat.
, pp. 241-244
-
-
Aoki, T.1
Kasai, R.2
Horiguchi, S.3
-
4
-
-
0020844943
-
An efficient numerical model of CMOS latch-up
-
Nov.
-
M.R. Pinto and R.W. Dutton, “An efficient numerical model of CMOS latch-up,” IEEE Electron Device Lett., vol. EDL-4, no. 11, Nov. 1983.
-
(1983)
IEEE Electron Device Lett.
, vol.4 EDL
, Issue.11
-
-
Pinto, M.R.1
Dutton, R.W.2
-
5
-
-
0020704130
-
A transient analysis of latch-up in bulk CMOS
-
Feb.
-
R.R. Troutman and H. Zappe, “A transient analysis of latch-up in bulk CMOS,” IEEE Trans. Electron Devices, vol. ED-30, no. 2, Feb. 1983.
-
(1983)
IEEE Trans. Electron Devices
, vol.30 ED
, Issue.2
-
-
Troutman, R.R.1
Zappe, H.2
-
6
-
-
84939321090
-
Quasi 2-D simulation of transient latch-up effect in VLSI CMOS circuits
-
to be published.
-
J. Harter, H. Jacobs, M. Zwar, and H. Skapa, “Quasi 2-D simulation of transient latch-up effect in VLSI CMOS circuits,” IEEE Trans. Electron Devices, to be published.
-
IEEE Trans. Electron Devices
-
-
Harter, J.1
Jacobs, H.2
Zwar, M.3
Skapa, H.4
-
7
-
-
0020945552
-
Transmission line model for latch-up in CMOS circuits
-
presented at the, Hawaii
-
R.R. Troutman and M.J. Hargrove, “Transmission line model for latch-up in CMOS circuits,” presented at the VLSI Symp., Hawaii, 1983.
-
(1983)
VLSI Symp.
-
-
Troutman, R.R.1
Hargrove, M.J.2
-
8
-
-
6144254353
-
A transmission line model for silicided diffusions: Impact on the performance of VLSI circuits
-
Apr.
-
D.B. Scott, W.R. Hunter, and H. Shichijo, “A transmission line model for silicided diffusions: Impact on the performance of VLSI circuits,” IEEE J. Solid-State Circuits, vol. SC-17, no. 2, Apr. 1982.
-
(1982)
IEEE J. Solid-State Circuits
, vol.17 SC
, Issue.2
-
-
Scott, D.B.1
Hunter, W.R.2
Shichijo, H.3
-
9
-
-
0015614368
-
Extended charge control model for bipolar transistors
-
J. Te Winkel, “Extended charge control model for bipolar transistors,” IEEE Trans. Electron Devices, vol. ED-20, no. 4, 1973.
-
(1973)
IEEE Trans. Electron Devices
, vol.20 ED
, Issue.4
-
-
Te Winkel, J.1
-
10
-
-
0022012209
-
Accurate trigger condition analysis for CMOS latch-up
-
Feb.
-
M.R. Pinto and R.W. Dutton, “Accurate trigger condition analysis for CMOS latch-up,” IEEE Electron Device Lett., vol. EDL-6, Feb. 1985.
-
(1985)
IEEE Electron Device Lett.
, vol.6 EDL
-
-
Pinto, M.R.1
Dutton, R.W.2
-
11
-
-
0022087622
-
The dynamics of latch-up turn-on behavior in scaled CMOS
-
July
-
S. Odanaka, M. Wakabayashi, and T. Ohzone, “The dynamics of latch-up turn-on behavior in scaled CMOS,” IEEE Trans. Electron Devices, vol. ED-32, pp. 1334–1340, July 1985.
-
(1985)
IEEE Trans. Electron Devices
, vol.32 ED
, pp. 1334-1340
-
-
Odanaka, S.1
Wakabayashi, M.2
Ohzone, T.3
-
12
-
-
84939357995
-
-
unpublished.
-
E. Sangiorgi, R.L. Johnston, M.R. Pinto, P.F. Bechtold, and W. Fichtner, “Temperature dependence of latch-up phenomena in scaled CMOS structures,” unpublished.
-
Temperature dependence of latch-up phenomena in scaled CMOS structures
-
-
Sangiorgi, E.1
Johnston, R.L.2
Pinto, M.R.3
Bechtold, P.F.4
Fichtner, W.5
-
13
-
-
0038185073
-
-
Stanford Elec. Labs., Stanford, CA, Tech. Rep. G201–9, Nov.
-
D.B. Estreich, “The physics and modeling of latch-up in CMOS integrated circuits,” Stanford Elec. Labs., Stanford, CA, Tech. Rep. G201–9, Nov. 1980.
-
(1980)
The physics and modeling of latch-up in CMOS integrated circuits
-
-
Estreich, D.B.1
-
14
-
-
84939365337
-
Design variations for suppressing latch-up in CMOS circuits by 2-D transient device simulation
-
H. Jacobs, R. Kircher, C. Werner, M. Strzempa-Depré, and K.-P. Karmann, “Design variations for suppressing latch-up in CMOS circuits by 2-D transient device simulation,” Proc. 2nd Conf. Simulation Semiconductor Devcies Processes (Swansea), 1986.
-
(1986)
Proc. 2nd Conf. Simulation Semiconductor Devcies Processes (Swansea)
-
-
Jacobs, H.1
Kircher, R.2
Werner, C.3
Strzempa-Depré, M.4
Karmann, K.P.5
-
15
-
-
0021390632
-
Layout considerations for preventing transiently triggered latch-up in CMOS
-
Mar.
-
R.R. Troutman and H. Zappe, “Layout considerations for preventing transiently triggered latch-up in CMOS,” IEEE Trans. Electron Devices, vol. ED-31, no. 3, Mar. 1984.
-
(1984)
IEEE Trans. Electron Devices
, vol.31 ED
, Issue.3
-
-
Troutman, R.R.1
Zappe, H.2
-
16
-
-
0022334720
-
Static and transient latch-up hardness in N-well CMOS with OnChip substrate bias generator
-
D. Takacs, J. Winnerl, and W. Reczek, “Static and transient latch-up hardness in N-well CMOS with OnChip substrate bias generator,” in IEDM Tech. Dig., 1985.
-
(1985)
IEDM Tech. Dig.
-
-
Takacs, D.1
Winnerl, J.2
Reczek, W.3
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