Determination of Phase Transformation Depth Profiles with Synchrotron Radiation

Journal of the American Ceramic Society

Volumn 70, Issue 4, 1987, Pages 227-231

  KEEFER, KEITH D ^a   MICHALSKE, TERRY A ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATORS, SYNCHROTRON - APPLICATIONS; CERAMIC MATERIALS - X-RAY ANALYSIS; FRACTURE MECHANICS - MATHEMATICAL MODELS; GLASS - PHASE TRANSITIONS;

CRACK PLANE INTERSECTION MODEL; PHASE TRANSFORMATION DEPTH PROFILES; SYNCHROTRON RADIATION;

REFRACTORY MATERIALS;

EID: 0023327856     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1987.tb04972.x     Document Type: Article

References (10)

1. Design of Transformation‐Toughened Ceramics
2. Transformation Toughening
3. Mechanics of Transformation Toughening in Brittle Materials
4. 2
5. X‐ray Analysis of the Transformed Zone in Partially Stabilized Zirconia (PSZ)
6. 2 System by X‐Ray Diffraction
7. 2