Design of testability for analogue fault diagnosis

International Journal of Circuit Theory and Applications

Volumn 15, Issue 2, 1987, Pages 123-142

  Wey, Chin‐Long ^a  

^a MICHIGAN STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER PROGRAMMING - ALGORITHMS;

ANALOG FAULT DIAGNOSIS ALGORITHM; DESIGN FOR TESTABILITY; SELF-TEST ALGORITHM;

INTEGRATED CIRCUITS;

EID: 0023326871     PISSN: 00989886     EISSN: 1097007X     Source Type: Journal    
DOI: 10.1002/cta.4490150204     Document Type: Article

References (29)

1. Special Issue on automatic analog fault diagnosis
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4. Node‐fault diagnosis and a design of testability
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6. The nonlinear analog fault diagnosis scheme of Wu, Nakajima, Wey, and Saeks in the tableau context
7. Criteria for analog fault diagnosis
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9. On the implementation of an analog ATPG: the linear case
10. On the connection assignment problem of diagnosable systems
11. Fault analysis in digital systems—a graph theoretic approach
12. A method of analog‐digital multiple fault diagnosis
13. On a theory of t‐diagnosable analog systems