Advances in charge neutralization for XPS measurements of nonconducting materials

Surface and Interface Analysis

Volumn 11, Issue 6-7, 1988, Pages 307-311

  Barth, G ^a   Linder, R ^a   Bryson, C ^a  

^a Surface Science Lab   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SPECTROSCOPY, X-RAY;

NONCONDUCTING MATERIALS; POSITIVE CHARGE BUILDUP; XPS MEASUREMENTS;

MATERIALS SCIENCE;

EID: 0023326033     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.740110607     Document Type: Article

References (8)

1. 8‐6
2. X-ray photoelectron spectroscopy analysis of hexafluorodianhydride–oxydianiline polyimide: Substantiation for substituent effects on aromatic carbon 1s binding energies