On the Repair of Redundant RAM's

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 6, Issue 2, 1987, Pages 222-231

  Wey, Chin Long ^a   Lombardi, Fabrizio ^b  

^a MICHIGAN STATE UNIVERSITY   (United States)

^b UNIVERSITY OF COLORADO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; COMPUTER SIMULATION; INTEGRATED CIRCUITS, VLSI - MANUFACTURE;

COMPUTER AIDED TESTING (CAT); REDUNDANT MEMORY;

DATA STORAGE, DIGITAL;

EID: 0023314554     PISSN: 02780070     EISSN: 19374151     Source Type: Journal    
DOI: 10.1109/TCAD.1987.1270266     Document Type: Article

References (16)

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