The Impact of Intrinsic Series Resistance on MOSFET Scaling

IEEE Transactions on Electron Devices

Volumn 34, Issue 3, 1987, Pages 503-511

  Ng, Kwok K ^a   Lynch, William T ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR DEVICES, MOSFET - MATHEMATICAL MODELS;

CONTACT RESISTANCE; DIFFUSION SHEET RESISTANCE; INTRINSIC SERIES RESISTANCE IMPACT; MOSFET SCALING;

ELECTRIC MEASUREMENTS;

EID: 0023310827     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1987.22956     Document Type: Article

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