Stress measurements in sol-gel films

Journal of Non-Crystalline Solids

Volumn 100, Issue 1-3, 1988, Pages 471-478

  Cerqua, Kathleen A ^a   Hayden, Joseph E ^a   LaCourse, William C ^b  

^a UNIVERSITY OF ROCHESTER   (United States)

^b ALFRED UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SILICA; STRESSES - MEASUREMENTS;

RESIDUAL STRESS; SILICA GELS; SOL-GEL FILMS;

GELS;

EID: 0023308872     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-3093(88)90066-X     Document Type: Article

References (12)

1. Optical thin films II: new developments