The heavy-ion microprobe at GSI - Used for single ion micromechanics

Nuclear Inst. and Methods in Physics Research, B

Volumn 30, Issue 3, 1988, Pages 284-288

  Fischer, B E ^a  

^a NONE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ETCHING; ION BEAMS; MICROANALYSIS; PARTICLE BEAM TRACKING;

MICROMECHANICS; MICROSCOPIC STRUCTURES; NUCLEAR TRACKS;

PARTICLE OPTICS;

EID: 0023308016     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(88)90012-2     Document Type: Article

References (6)

1. Influence of irradiation with high energetic ions on storage properties of magneto-optic (Gd, Bi)3(Fe, Ga)5O12 epitaxial films
2. Preparation of superinsulating surfaces by the nuclear track technique
3. Total Yield and Escape Depth of Electrons from Heavy Ion Solid Interactions
4. Production and use of nuclear tracks: imprinting structure on solids