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Volumn 134, Issue 1, 1987, Pages 25-29

IMPLEMENTATION OF MICROWAVE DIFFRACTION TOMOGRAPHY FOR MEASUREMENT OF DIELECTRIC CONSTANT DISTRIBUTION.

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS - MEASUREMENTS; MICROWAVE MEASUREMENTS;

EID: 0023287798     PISSN: 0950107X     EISSN: None     Source Type: Journal    
DOI: 10.1049/ip-h-2.1987.0006     Document Type: Article
Times cited : (10)

References (12)
  • Reference 정보가 존재하지 않습니다.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.