SELF-LIMITING BEHAVIOR OF HOT CARRIER DEGRADATION AND ITS IMPLICATION ON THE VALIDITY OF LIFETIME EXTRACTION BY ACCELERATED STRESS.

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1987, Pages 191-194

  Cham, Kit M ^a   Hui, John ^a   Vande Voorde, Paul ^a   Fu, H S ^a  

^a HEWLETT PACKARD LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS, VLSI;

ACCELERATED STRESS; HOT CARRIER DEGRADATION;

SEMICONDUCTOR DEVICES, MOSFET;

EID: 0023271732     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)