DUAL BOUNDS VARIATIONAL FORMULATION OF SKIN EFFECT PROBLEMS.

IEEE MTT-S International Microwave Symposium Digest

Volumn , Issue , 1987, Pages 333-336

  Waldow, Peter ^a   Wolff, Ingo ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS, MONOLITHIC - MICROWAVES; MICROSTRIP DEVICES - ANALYSIS;

CLASSICAL FULL-WAVE ANALYSIS; DUAL BOUNDS VARIATIONAL FORMULATION; SKIN EFFECT PROBLEMS;

ELECTRIC NETWORKS, COMMUNICATION;

EID: 0023249969     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/mwsym.1987.1132398     Document Type: Conference Paper

References (8)