EFFICIENT GO/NO-GO TESTING OF ANALOG CIRCUITS.

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn , Issue , 1987, Pages 414-417

  Milor, Linda ^a   Visvanathan, V ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC EQUIPMENT TESTING;

ANALOG CIRCUITS; ANALOG TESTING; CMOS ANALOG SUBNETWORKS; DC TESTING; GO/NO-GO TESTING;

INTEGRATED CIRCUIT TESTING;

EID: 0023249608     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)