INTERELECTRODE METAL MIGRATION ON GAAS.

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1987, Pages 102-106

  Kretschmer, K H ^a   Hartnagel, H L ^a  

^a DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FILMS - CHEMICAL VAPOR DEPOSITION; SPECTROSCOPY;

INTERELECTRODE METAL MIGRATION; MATERIAL TRANSPORT; X-RAY-PHOTOELECTRON SPECTROSCOPY; XPS;

SEMICONDUCTING GALLIUM ARSENIDE;

EID: 0023249421     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)