PULSED CURRENT ELECTROMIGRATION FAILURE MODEL.

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1987, Pages 136-139

  Brooke, Laura ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM AND ALLOYS; ELECTRIC CONDUCTORS - FAILURE; ELECTRIC MEASUREMENTS; MATHEMATICAL MODELS; SEMICONDUCTING SILICON;

ELECTROMIGRATION; ELECTROMIGRATION FAILURE MODEL; PULSED CURRENT;

INTEGRATED CIRCUITS;

EID: 0023172885     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/irps.1987.362169     Document Type: Conference Paper

References (13)