SELF TEST USING UNEQUIPROBABLE RANDOM PATTERNS.

Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)

Volumn , Issue , 1987, Pages 258-263

  Wunderlich, Hans Joachim ^a  

^a UNIVERSITY OF KARLSRUHE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTERS, DIGITAL - SHIFT REGISTERS; INTEGRATED CIRCUIT TESTING - AUTOMATIC TESTING; LOGIC CIRCUITS, COMBINATORIAL - AUTOMATIC TESTING;

BILBOS; LINEAR FEEDBACK SHIFT REGISTERS; SELF-TEST MODULES; SIGNATURE ANALYSIS; TEST PATTERN GENERATION;

LOGIC CIRCUITS;

EID: 0023170014     PISSN: 07313071     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (21)