WAFER-SCALE 170,000-GATE FFT PROCESSOR WITH BUILT-IN TEST CIRCUITS.

Proceedings of the Custom Integrated Circuits Conference

Volumn , Issue , 1987, Pages 207-210

  Yamashita, Koichi ^a   Kanasugi, Akinori ^a   Hijiya, Shinpei ^a   Goto, Gensuke ^a   Matsumura, Nobutake ^a   Shirato, Takehide ^a  

^a FUJITSU LABORATORIES LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; LOGIC DEVICES - GATES; MATHEMATICAL TRANSFORMATIONS - FAST FOURIER TRANSFORMS;

BUILT-IN TEST CIRCUITS; WAFER-SCALE 170,000-GATE FFT PROCESSOR;

MATHEMATICAL TRANSFORMATIONS;

EID: 0023166982     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)