Submicrometer-Channel CMOS for Low-Temperature Operation

IEEE Transactions on Electron Devices

Volumn 34, Issue 1, 1987, Pages 19-27

  Sun, Jack Yuan Chen ^a   Taur, Yuan ^a   Dennard, Robert H ^a   Klepner, Stephen P ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYOGENICS; TRANSISTORS - JUNCTIONS;

DESIGN OPTIMIZATION; N-WELL CMOS PROCESS; SHALLOW JUNCTIONS; SUBMICROMETER CHANNEL COMPLEMENTARY MOS (CMOS);

SEMICONDUCTOR DEVICES, MOS;

EID: 0023120271     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1987.22881     Document Type: Article

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