Nonideal Base Current in Bipolar Transistors at Low Temperatures

IEEE Transactions on Electron Devices

Volumn 34, Issue 1, 1987, Pages 130-138

  Woo, Jason C S ^a   Plummer, James D ^a   Stork, Johannes M C ^b  

^a STANFORD UNIVERSITY   (United States)

^b IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC MEASUREMENTS - CURRENT;

BASE CURRENT DETERMINATION; POOLE-FRENKEL HIGH FIELD EFFECT; SHOCKLEY-READ-HALL THEORY; TRAP LEVELS;

TRANSISTORS, BIPOLAR;

EID: 0023089947     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1987.22895     Document Type: Article

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