MAJORITY AND MINORITY CARRIER TRANSPORT IN POLYSILICON EMITTER CONTACTS.

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1986, Pages 28-31

  Crabbe, E ^a   Swirhun, S ^a   del Alamo, J ^a   Pease, R F W ^a   Swanson, R M ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONTACTS, OHMIC; ELECTRIC MEASUREMENTS - RESISTANCE; TRANSISTORS, BIPOLAR - MEASUREMENTS;

BASE CURRENT/EMITTER RESISTANCE TRADE-OFF; KELVIN RESISTOR STRUCTURE; MAJORITY AND MINORITY CARRIER TRANSPORT; P-N-P TEST TRANSISTOR; POLYSILICON EMITTER CONTACTS;

SEMICONDUCTING SILICON COMPOUNDS;

EID: 0023033551     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/iedm.1986.191102     Document Type: Conference Paper

References (7)