SCALING LAW OF ALPHA-PARTICLE INDUCED SOFT ERRORS FOR VLSI'S.

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1986, Pages 542-545

  Takeda, E ^a   Takeuchi, K ^a   Yamasaki, E ^a   Toyabe, T ^a   Ohshima, K ^a   Itoh, K ^a  

^a HITACHI LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ALPHA-PARTICLE-INDUCED SOFT ERROR RATE (SER); EFFECTIVE FUNNELING LENGTH; MEGABIT MEMORY CELL SIZE DEPENDENCE; THREE-DIMENSIONAL DEVICE SIMULATOR;

INTEGRATED CIRCUITS, VLSI;

EID: 0023014325     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/iedm.1986.191243     Document Type: Conference Paper

References (7)