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Volumn , Issue , 1986, Pages 228-231
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VARIATIONAL ANALYSIS OF INTEGRATED CIRCUITS.
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Author keywords
[No Author keywords available]
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Indexed keywords
INTEGRATED CIRCUIT MANUFACTURE;
SEMICONDUCTOR DEVICES, MOS - COMPUTER AIDED DESIGN;
COMPLEMENTARY MOS (CMOS) CIRCUITS;
DESIGN MANUFACTURABILITY;
GENERALIZED WORST-CASE ANALYSIS;
LARGE-CHANGE DESIGN SENSITIVITIES;
VARIATIONAL ANALYSIS;
INTEGRATED CIRCUITS;
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EID: 0023012322
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (4)
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References (10)
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