Current-Leakage Failures in Hybrid Microcircuits

IEEE Transactions on Components, Hybrids, and Manufacturing Technology

Volumn 9, Issue 4, 1986, Pages 403-409

  Benson, Richard C ^a   Romenesko, Bruce M ^a   Nall, Berry H ^a   Dehaas, Newman ^a   Charles, Harry K ^a  

^a JOHNS HOPKINS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FAULT CURRENTS - LEAKAGE CURRENTS; ELECTRONICS PACKAGING - CONTAMINATION; FAILURE ANALYSIS; SPECTROSCOPY, AUGER ELECTRON;

CURRENT-LEAKAGE FAILURES; METAL MIGRATION;

INTEGRATED CIRCUITS, HYBRID;

EID: 0023011995     PISSN: 01486411     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCHMT.1986.1136664     Document Type: Article

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