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Volumn 22, Issue 1-4, 1987, Pages 251-265
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Microstructural analysis of in-situ Cu-Nb composite wires
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
MICROSCOPIC EXAMINATION - SCANNING ELECTRON MICROSCOPY;
COMPOSITE WIRES;
SAMPLE PREPARATION;
SUPERCONDUCTING WIRES;
TRANSMISSION ELECTRON MICROSCOPY;
TWO-PHASE WIRES;
SUPERCONDUCTING MATERIALS;
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EID: 0022990148
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/0304-3991(87)90069-6 Document Type: Article |
Times cited : (72)
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References (20)
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