SINGLE EVENT CHARGE COLLECTION MODELING IN CMOS MULTI-JUNCTIONS STRUCTURE.

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1986, Pages 538-541

  Chern, J H ^a   Seitchik, J A ^a   Yang, P ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL MODELS; SEMICONDUCTOR DEVICES - JUNCTIONS;

BIPOLAR PHASE; FUNNELING PHASE; MULTIJUNCTION STRUCTURES; PROCESS PHASES; SINGLE EVENT CHARGE COLLECTION MODELING;

SEMICONDUCTOR MATERIALS;

EID: 0022987201     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/iedm.1986.191242     Document Type: Conference Paper

References (10)