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Volumn , Issue 79, 1986, Pages 25-30
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GROWTH AND CHARACTERIZATION OF UNDOPED DISLOCATION FREE GaAs BY ARSENIC AMBIENT CONTROLLED LEC WITH THE AID OF X-RAY IMAGING SYSTEM.
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTALS - DISLOCATIONS;
X-RAYS - IMAGING TECHNIQUES;
CONTROLLED LEC;
EUTECTIC ETCHING;
LEC GROWTH;
SINGLE CRYSTALS;
SLIP BANDS;
X-RAY SHADOW IMAGING;
SEMICONDUCTING GALLIUM ARSENIDE;
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EID: 0022983937
PISSN: 03730751
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (4)
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References (5)
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