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Volumn 661, Issue , 1986, Pages 116-124
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OPTIMAL REMOVAL OF ALL MISLOCATION EFFECTS IN INTERFEROMETRIC TESTS.
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Author keywords
[No Author keywords available]
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Indexed keywords
OPTICAL SYSTEMS - FOCUSING;
ABERRATION FUNCTION;
INTERFEROMETRIC TESTS;
LARGE ASPHERIC OPTIC;
MISLOCATION EFFECTS;
WAVEFRONT ABERRATIONS;
INTERFEROMETRY;
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EID: 0022959977
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.938600 Document Type: Conference Paper |
Times cited : (11)
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References (3)
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