MECHANICAL STRESS AND HYDROGEN EFFECTS ON HOT CARRIER INJECTION.

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1986, Pages 386-389

  Mitsuhashi, J ^a   Nakao, S ^a   Matsukawa, T ^a  

^a MITSUBISHI ELECTRIC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTING SILICON COMPOUNDS;

DEVICE LIFETIME IMPROVEMENT; ELECTRIC STRESS; HOT CARRIER INJECTION; HYDROGEN EFFECTS; MECHANICAL STRESS EFFECT;

SEMICONDUCTOR DEVICES, MOSFET;

EID: 0022957464     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/iedm.1986.191199     Document Type: Conference Paper

References (10)