PARTITIONING CIRCUITS FOR IMPROVED TESTABILITY.

Volumn , Issue , 1986, Pages 91-106

  Bhatt, Sandeep N ^a   Chung, Fan R K ^a   Rosenberg, Arnold L ^a  

^a YALE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; COMPUTER PROGRAMMING - ALGORITHMS; LOGIC CIRCUITS, COMBINATORIAL - AUTOMATIC TESTING;

CIRCUIT PARTITIONING; LSSD DESIGN DISCIPLINE; SELF-TESTING; TESTABILITY;

INTEGRATED CIRCUITS, VLSI;

EID: 0022918735     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)