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Volumn 6, Issue 4, 1986, Pages 349-380

Mechanism of etching and of surface modification of polyimide in RF and LF SF6-O2 discharges

Author keywords

O2; plasma etching; Polyimide; SF6; surface modification

Indexed keywords

ETCHING; PLASMAS - APPLICATIONS; SURFACES - PROCESSING;

EID: 0022905846     PISSN: 02724324     EISSN: 15728986     Source Type: Journal    
DOI: 10.1007/BF00565550     Document Type: Article
Times cited : (42)

References (26)
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    • F. Egitto, V. Vukanovic, R. Horwath, and F. Emmi, in Proc. 7th Int. Symp. Plasma Chemistry, C. J. Timmermand, ed., Eindhoven, The Netherlands (1985), Vol. 3, p. 983.
  • 3
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    • K. Takahashi, H. Kasai, M. Kogoma, T. Moriwaki, and S. Okazaki, in Proc. 9th Symp. on ISIAT 85, Tokyo, Japan, p. 413.
  • 4
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    • A. Picard, Thèse de 3e Cycle, Université de Nantes, France, 14 Nov. 1984, unpublished.
  • 5
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    • H. H. Sawin, B. E. Thompson, and A. D. Richards, in 166th Meeting Electrochem. Soc., New-Orleans, USA, Oct. 1984, abstract No. 401.
  • 9
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    • A. Picard, G. Turban, and B. Grolleau, J. Phys. D. Appl. Phys. 1986, in press.
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    • A. Dilks and E Kay, Plasma Polymerization, ACS Series, No. 108, Washington DC (1979), p. 195.
  • 13
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    • D. T. Clark, CRC Critical Review in Solid State and Materials Sciences, 1978, p. 1.
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    • T. Wydeven, C. C. Johnson, M. A. Golub, M. S. Hsu, and N. R. Lerner, Plasma Polymerization, ACS series, No. 108, Washington DC (1979), p. 299.
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    • Handbook of X Ray Photoelectron Spectroscopy, Perkin-Elmer.
  • 17
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    • S. V. Babu and L. A. Tiemann, in Proc. 7th Int. Symp. Plasma Chemistry, C. J. Timmermans, ed. Eindhoven, The Netherlands (1985), Vol. 3, p. 1025.
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    • R. J. Lagow, J. L. Adcock, and S. Inone, US Patent No. 4,144,374.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.